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Surface Analysis Solutions

Surface Analysis Solution Lines


Atom scattering spectroscopy for surface structure and elemental analysis

The low energy ion scattering spectroscopy (LEIS) is a powerful method for surface crystal structure and elemental composition analysis of then topmost several layers of the crystal surface. However, analyses of insulator surfaces have been very difficult because of the electric charge-up caused by ions. To overcome the difficulties of charge up effects on insulator surfaces, we have developed a new type of surface instrument, TOFLAS-3000 (Time Of Flight Low energy Atom Scattering spectroscopy).


November, 2012
Pascal Co., Ltd. builds the Ibaraki Factory at Naka-city Ibaraki Japan.
September, 2010
Pascal Co., Ltd. introduces TOFLAS-3000; the New Surface Analysis Solution using Atom Scattering Spectroscopy.
April, 2008
Pascal Co., Ltd. starts to produce Cryo Cooler Series for optical, electrical or hall effect measurements.
Febrary, 2008
Pascal Co., Ltd. builds the New Head Office and moves there
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